C. Shiah, C. N. Chang, R. Crisp, C. P. Lin, C. Pan, C. P. Chuang, H. L. Chen, S. Jheng, T. Chang, W. Huang, K. Ting, Rick Dai, W. Huang, B. Rong, Nicky Lu
{"title":"4.8GB/s 256Mb(x16)低引脚数DRAM和控制器架构(RPCA),可降低物联网/可穿戴/TCON/视频/ ai边缘系统的外形尺寸和成本","authors":"C. Shiah, C. N. Chang, R. Crisp, C. P. Lin, C. Pan, C. P. Chuang, H. L. Chen, S. Jheng, T. Chang, W. Huang, K. Ting, Rick Dai, W. Huang, B. Rong, Nicky Lu","doi":"10.23919/VLSIC.2019.8778049","DOIUrl":null,"url":null,"abstract":"A new breed of Form-Factor-Driven DRAMs offers 80% lower standby power and > 50% IO signal reduction vs. Capacity-Driven commodity DRAM. Command/address/data are multiplexed onto 16 pins and combined with a Serial Control Pin in a Single-Edge-Pinout-Floorplan, providing bus efficiency >98%. Major SOC-DRAM subsystem cost savings are enabled via die size, packaging and PCB area savings using this RPCA. A 100x speedup of array fills using a new Group Write circuit further reduces test cost.","PeriodicalId":6707,"journal":{"name":"2019 Symposium on VLSI Circuits","volume":"27 1","pages":"C116-C117"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A 4.8GB/s 256Mb(x16) Reduced-Pin-Count DRAM and Controller Architecture (RPCA) to Reduce Form-Factor & Cost for IOT/Wearable/TCON/Video/AI-Edge Systems\",\"authors\":\"C. Shiah, C. N. Chang, R. Crisp, C. P. Lin, C. Pan, C. P. Chuang, H. L. Chen, S. Jheng, T. Chang, W. Huang, K. Ting, Rick Dai, W. Huang, B. Rong, Nicky Lu\",\"doi\":\"10.23919/VLSIC.2019.8778049\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new breed of Form-Factor-Driven DRAMs offers 80% lower standby power and > 50% IO signal reduction vs. Capacity-Driven commodity DRAM. Command/address/data are multiplexed onto 16 pins and combined with a Serial Control Pin in a Single-Edge-Pinout-Floorplan, providing bus efficiency >98%. Major SOC-DRAM subsystem cost savings are enabled via die size, packaging and PCB area savings using this RPCA. A 100x speedup of array fills using a new Group Write circuit further reduces test cost.\",\"PeriodicalId\":6707,\"journal\":{\"name\":\"2019 Symposium on VLSI Circuits\",\"volume\":\"27 1\",\"pages\":\"C116-C117\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/VLSIC.2019.8778049\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2019.8778049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 4.8GB/s 256Mb(x16) Reduced-Pin-Count DRAM and Controller Architecture (RPCA) to Reduce Form-Factor & Cost for IOT/Wearable/TCON/Video/AI-Edge Systems
A new breed of Form-Factor-Driven DRAMs offers 80% lower standby power and > 50% IO signal reduction vs. Capacity-Driven commodity DRAM. Command/address/data are multiplexed onto 16 pins and combined with a Serial Control Pin in a Single-Edge-Pinout-Floorplan, providing bus efficiency >98%. Major SOC-DRAM subsystem cost savings are enabled via die size, packaging and PCB area savings using this RPCA. A 100x speedup of array fills using a new Group Write circuit further reduces test cost.