微处理器功能单元硬延迟故障的低成本运行时诊断

S. Ozev, Daniel J. Sorin, Mahmut Yilmaz
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引用次数: 6

摘要

本文研究了微处理器功能单元延迟故障的运行时诊断问题。尽管卡在断层模型很受欢迎,但它不再是唯一相关的断层模型。延迟故障模型——假设故障电路元件得到了正确的值,但这个值到达得太晚了——包含了现代微处理器中许多实际的现场损耗故障。现场磨损故障,如随时间变化的介质击穿和电迁移,会导致信号传播延迟,而这些延迟可能在生产测试期间被忽略。这些缺陷随着时间呈指数级增长,可能导致灾难性的失败。我们的目标是在硬延迟故障导致灾难性芯片故障之前,在运行期间诊断硬延迟故障(即,将它们识别为硬故障,而不是瞬态故障)。结果表明,我们可以诊断出所有的注入延迟故障,而先前的诊断机制只针对卡滞故障,忽略了大部分故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only relevant fault model. The delay fault model - which assumes that the faulty circuit element gets the correct value but that this value arrives too late - encompasses many of the actual in-field wearout faults in modern microprocessors. In-field wearout faults, such as time-dependent dielectric breakdown and electromigration, cause signal propagation delays which may be missed during production test time. These defects progress exponentially over time, potentially causing a catastrophic failure. Our goal is to diagnose hard delay faults (i.e., identify them as hard faults, not transients) during run-time before they lead to catastrophic chip failures. Results show that we can diagnose all injected delay faults and that prior diagnosis mechanisms, which target only stuck-at faults, miss the majority of them.
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