{"title":"基于快速STA预测的门级时序仿真","authors":"T. B. Ahmad, M. Ciesielski","doi":"10.7873/DATE.2014.261","DOIUrl":null,"url":null,"abstract":"Traditional dynamic simulation with standard delay format (SDF) back-annotation cannot be reliably performed on large designs. The large size of SDF files makes the event-driven timing simulation extremely slow as it has to process an excessive number of events. In order to accelerate gate-level timing simulation we propose an automated fast prediction-based gatelevel timing simulation that combines static timing analysis (STA) at the block level with dynamic timing simulation at the I/O interfaces. We demonstrate that the proposed timing simulation can be done earlier in the design cycle in parallel with synthesis.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"32 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Fast STA prediction-based gate-level timing simulation\",\"authors\":\"T. B. Ahmad, M. Ciesielski\",\"doi\":\"10.7873/DATE.2014.261\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Traditional dynamic simulation with standard delay format (SDF) back-annotation cannot be reliably performed on large designs. The large size of SDF files makes the event-driven timing simulation extremely slow as it has to process an excessive number of events. In order to accelerate gate-level timing simulation we propose an automated fast prediction-based gatelevel timing simulation that combines static timing analysis (STA) at the block level with dynamic timing simulation at the I/O interfaces. We demonstrate that the proposed timing simulation can be done earlier in the design cycle in parallel with synthesis.\",\"PeriodicalId\":6550,\"journal\":{\"name\":\"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"volume\":\"32 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-03-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.7873/DATE.2014.261\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7873/DATE.2014.261","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fast STA prediction-based gate-level timing simulation
Traditional dynamic simulation with standard delay format (SDF) back-annotation cannot be reliably performed on large designs. The large size of SDF files makes the event-driven timing simulation extremely slow as it has to process an excessive number of events. In order to accelerate gate-level timing simulation we propose an automated fast prediction-based gatelevel timing simulation that combines static timing analysis (STA) at the block level with dynamic timing simulation at the I/O interfaces. We demonstrate that the proposed timing simulation can be done earlier in the design cycle in parallel with synthesis.