{"title":"开关频率对离散晶体管DC-DC PoL变换器可靠性影响的研究","authors":"Dan Butnicu, A. Cracan, D. Neacşu","doi":"10.1109/OPTIM-ACEMP50812.2021.9590018","DOIUrl":null,"url":null,"abstract":"Using a buck converter to regulate voltage, PoL DC-DC converters involve an inherent switching action via switching frequency fsw. The value of the switching frequency can influence the entire performance of the converter and this justifies the importance of this study. This paper is analyzing the influence of switching frequency on the reliability of the DC-DC PoL converter. This is demonstrated in terms of efficiency, thermal response, and ripple. In addition, several bench test results are shown for a switching frequency variation in a range of 50 kHz to 500 kHz, using a discrete SiMOSFET based PoL synchronous buck converter evaluation board. The switching loss in power devices, as well as the driver loss, are directly influenced by the switching frequency. The reliability calculation is based on the temperature of the device when the converter is working on a common load. A thermal scanning of the MOSFET surface is herein based on infrared photography. A modern prediction standard, like IEC-TR-62380, takes into account the concept of mission profile and it has been used to deliver information about the reliability of the converter as close as possible to reality.","PeriodicalId":32117,"journal":{"name":"Bioma","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Study of Switching Frequency Impact on Reliability of DC-DC PoL Converters with Discrete Transistors\",\"authors\":\"Dan Butnicu, A. Cracan, D. Neacşu\",\"doi\":\"10.1109/OPTIM-ACEMP50812.2021.9590018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Using a buck converter to regulate voltage, PoL DC-DC converters involve an inherent switching action via switching frequency fsw. The value of the switching frequency can influence the entire performance of the converter and this justifies the importance of this study. This paper is analyzing the influence of switching frequency on the reliability of the DC-DC PoL converter. This is demonstrated in terms of efficiency, thermal response, and ripple. In addition, several bench test results are shown for a switching frequency variation in a range of 50 kHz to 500 kHz, using a discrete SiMOSFET based PoL synchronous buck converter evaluation board. The switching loss in power devices, as well as the driver loss, are directly influenced by the switching frequency. The reliability calculation is based on the temperature of the device when the converter is working on a common load. A thermal scanning of the MOSFET surface is herein based on infrared photography. A modern prediction standard, like IEC-TR-62380, takes into account the concept of mission profile and it has been used to deliver information about the reliability of the converter as close as possible to reality.\",\"PeriodicalId\":32117,\"journal\":{\"name\":\"Bioma\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Bioma\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OPTIM-ACEMP50812.2021.9590018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Bioma","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OPTIM-ACEMP50812.2021.9590018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
摘要
PoL - DC-DC变换器采用降压变换器调节电压，通过开关频率fsw实现固有的开关动作。开关频率的取值会影响变换器的整体性能，这证明了本研究的重要性。本文分析了开关频率对DC-DC变换器可靠性的影响。这在效率、热响应和波纹方面得到了证明。此外，使用基于离散simmosfet的PoL同步降压转换器评估板，显示了在50 kHz至500 kHz范围内开关频率变化的几个台架测试结果。开关频率直接影响功率器件的开关损耗和驱动器损耗。可靠性计算是基于变换器在普通负载上工作时设备的温度。本文基于红外摄影技术对MOSFET表面进行热扫描。现代预测标准，如IEC-TR-62380，考虑到任务轮廓的概念，并已被用于提供有关变流器可靠性的信息，尽可能接近现实。
A Study of Switching Frequency Impact on Reliability of DC-DC PoL Converters with Discrete Transistors
Using a buck converter to regulate voltage, PoL DC-DC converters involve an inherent switching action via switching frequency fsw. The value of the switching frequency can influence the entire performance of the converter and this justifies the importance of this study. This paper is analyzing the influence of switching frequency on the reliability of the DC-DC PoL converter. This is demonstrated in terms of efficiency, thermal response, and ripple. In addition, several bench test results are shown for a switching frequency variation in a range of 50 kHz to 500 kHz, using a discrete SiMOSFET based PoL synchronous buck converter evaluation board. The switching loss in power devices, as well as the driver loss, are directly influenced by the switching frequency. The reliability calculation is based on the temperature of the device when the converter is working on a common load. A thermal scanning of the MOSFET surface is herein based on infrared photography. A modern prediction standard, like IEC-TR-62380, takes into account the concept of mission profile and it has been used to deliver information about the reliability of the converter as close as possible to reality.
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