G. Decker, O. Singh, H. Friedsam, J. Jones, M. Ramanathan, D. Shu
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引用次数: 7
摘要
随着最近的发展,x射线束位置监测器(bpm)能够精确测量到亚微米级的光子位置。然而,当安装在插入设备的光束线上时,由于沿光束线行进的杂散辐射会污染插入设备的光子,因此x射线光束位置监测器的真实性能受到严重限制。杂散辐射来自于上游和下游的偶极磁体边缘场、转向校正器以及偏离轨迹的六极和四极。虽然APS已经取得了重大进展,使用从平移阶段扫描派生的查找表来补偿这种影响,但迄今为止,ID x - bpm的性能仅在10到20微米的水平。为了解决这个问题,目前正在进行的一项研究工作包括在加速器晶格中引入一个弯道,以引导x射线BPM叶片的杂散辐射。插入装置的水平平行平移只允许来自两个附近校正器的ID光子和辐射沿光束线传播,大大简化了辐射模式。一项详细的射线追踪分析表明,在X-BPM位置,杂散辐射被水平偏移了2厘米,因此很容易被掩盖。本文报道了在其中一个插入器件上实现的这种改进晶格的结果。
Reduction of X-BPM systematic errors by modification of lattice in the APS storage ring
With recent developments, X-ray beam position monitors (BPMs) are capable of making accurate photon position measurements down to the sub-micron level. The true performance of X-ray beam position monitors when installed on insertion device beamlines is, however, severely limited due to the stray radiation traveling along the beamline that contaminates the insertion device photons. The stray radiation emanates from upstream and downstream dipole magnet fringe fields, from steering correctors, and from sextupoles and quadrupoles with offset trajectories. While significant progress has been made at the APS using look-up tables derived from translation stage scans to compensate for this effect, performance of ID X-BPMs to date is at the 10 to 20 micron level. A research effort presently underway to address this issue involves the introduction of a chicane into the accelerator lattice to steer the stray radiation away from the X-ray BPM blades. A horizontal parallel translation of the insertion device allows only ID photons and radiation from two nearby correctors to travel down the beamline, simplifying the radiation pattern considerably. A detailed ray tracing analysis has shown that stray radiation gets displaced by up to 2 cm horizontally at the X-BPM locations so that it can be easily masked. Results from such a modified lattice, implemented for one of the insertion devices, are reported here.