利用电光探头扫描系统精确测量TE02模式转换器的场模式

IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference Pub Date : 2014-04-22 DOI:10.1109/IVEC.2014.6857693

I. Lee, Kwang hoon Kim, M. Choe, Dong-Joon Lee, E. Choi

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引用次数: 1

摘要

本文介绍了一种采用稳定电光场探头的优良场扫描系统的电场模式测量。它提供比金属探针更高的分辨率和更少的场畸变。利用CST Microwave Studio对TE02回旋管模式转换器进行了仿真，并估计了模式转换器在28ghz时的场方向图。现场校准的EO传感器显示高达60 dB的信噪比(SNR)。最后，我们使用交叉相关函数(CCF)比较了这两个结果。给出了电磁探头扫描系统的原理图和估计结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Precise measurement of field patterns from a TE02 mode converter using the electro-optic probe scanning system

This paper presents electric field pattern measurements by an excellent field scanning system using a stable electro-optic (EO) field probe. It provides higher resolution and less field distortions than a metal based probe. We simulated a TE02 gyrotron mode converter by CST Microwave Studio and estimated the mode converter field pattern at 28 GHz. The field-calibrated EO sensor demonstrated up to 60 dB of Signal to Noise Ratio (SNR). Finally, we compared both results using the Cross Correlation Function (CCF). The schematic of the EO probe scanning system and estimation results are provided.

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IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference

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