一个2.98nW带隙基准电压,采用自调谐低漏采样和保持器

Yen-Po Chen, Matthew R. Fojtik, D. Blaauw, D. Sylvester
{"title":"一个2.98nW带隙基准电压,采用自调谐低漏采样和保持器","authors":"Yen-Po Chen, Matthew R. Fojtik, D. Blaauw, D. Sylvester","doi":"10.1109/VLSIC.2012.6243859","DOIUrl":null,"url":null,"abstract":"A novel low power bandgap voltage reference using a sample and hold circuit with self-calibrating duty cycle and leakage compensation is presented. Measurements of 0.18μm CMOS test chips show a temperature coefficient of 24.7ppm/°C and power consumption of 2.98nW, marking a 251× power reduction over the previous lowest power bandgap reference.","PeriodicalId":6347,"journal":{"name":"2012 Symposium on VLSI Circuits (VLSIC)","volume":"19 1","pages":"200-201"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"A 2.98nW bandgap voltage reference using a self-tuning low leakage sample and hold\",\"authors\":\"Yen-Po Chen, Matthew R. Fojtik, D. Blaauw, D. Sylvester\",\"doi\":\"10.1109/VLSIC.2012.6243859\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel low power bandgap voltage reference using a sample and hold circuit with self-calibrating duty cycle and leakage compensation is presented. Measurements of 0.18μm CMOS test chips show a temperature coefficient of 24.7ppm/°C and power consumption of 2.98nW, marking a 251× power reduction over the previous lowest power bandgap reference.\",\"PeriodicalId\":6347,\"journal\":{\"name\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"volume\":\"19 1\",\"pages\":\"200-201\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2012.6243859\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Symposium on VLSI Circuits (VLSIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2012.6243859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31

摘要

提出了一种新型的低功耗带隙基准电压,采用自校准占空比和漏损补偿的采样保持电路。0.18μm CMOS测试芯片的温度系数为24.7ppm/°C,功耗为2.98nW,与之前的最低功耗带隙基准相比,功耗降低了251倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 2.98nW bandgap voltage reference using a self-tuning low leakage sample and hold
A novel low power bandgap voltage reference using a sample and hold circuit with self-calibrating duty cycle and leakage compensation is presented. Measurements of 0.18μm CMOS test chips show a temperature coefficient of 24.7ppm/°C and power consumption of 2.98nW, marking a 251× power reduction over the previous lowest power bandgap reference.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信