基于边缘效应场效应管LM-GA CiM分层可调再训练的写入变化与可靠性误差补偿

Shinsei Yoshikiyo, Naoko Misawa, K. Toprasertpong, Shinichi Takagi, C. Matsui, Ken Takeuchi
{"title":"基于边缘效应场效应管LM-GA CiM分层可调再训练的写入变化与可靠性误差补偿","authors":"Shinsei Yoshikiyo, Naoko Misawa, K. Toprasertpong, Shinichi Takagi, C. Matsui, Ken Takeuchi","doi":"10.1587/transele.2022cdp0004","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"30 1","pages":"352-364"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Write Variation & Reliability Error Compensation by Layer-Wise Tunable Retraining of Edge FeFET LM-GA CiM\",\"authors\":\"Shinsei Yoshikiyo, Naoko Misawa, K. Toprasertpong, Shinichi Takagi, C. Matsui, Ken Takeuchi\",\"doi\":\"10.1587/transele.2022cdp0004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13259,\"journal\":{\"name\":\"IEICE Trans. Electron.\",\"volume\":\"30 1\",\"pages\":\"352-364\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEICE Trans. Electron.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1587/transele.2022cdp0004\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEICE Trans. Electron.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/transele.2022cdp0004","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Write Variation & Reliability Error Compensation by Layer-Wise Tunable Retraining of Edge FeFET LM-GA CiM
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