Yuhua Cheng, M. Jeng, Zhihong Liu, Kai Chen, M. Chan, C. Hu, Ping Keung Kox
{"title":"基于物理的深亚微米模拟/数字电路仿真BSIM模型的鲁棒性、准确性和仿真性能研究","authors":"Yuhua Cheng, M. Jeng, Zhihong Liu, Kai Chen, M. Chan, C. Hu, Ping Keung Kox","doi":"10.1109/CICC.1996.510567","DOIUrl":null,"url":null,"abstract":"We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in HSpice, Spectre, SmartSpice and Spice3e2.","PeriodicalId":74515,"journal":{"name":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","volume":"5 1","pages":"321-324"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"An investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicronmeter BSIM model for analog/digital circuit simulation\",\"authors\":\"Yuhua Cheng, M. Jeng, Zhihong Liu, Kai Chen, M. Chan, C. Hu, Ping Keung Kox\",\"doi\":\"10.1109/CICC.1996.510567\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in HSpice, Spectre, SmartSpice and Spice3e2.\",\"PeriodicalId\":74515,\"journal\":{\"name\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"volume\":\"5 1\",\"pages\":\"321-324\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1996.510567\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1996.510567","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicronmeter BSIM model for analog/digital circuit simulation
We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in HSpice, Spectre, SmartSpice and Spice3e2.