弹性邮票辅助剥离和转移图案化石墨烯层

Farid Sayar Irani, M. Yapici
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引用次数: 0

摘要

石墨烯具有机械强度和优异的导电性和导热性,是一种有趣的微电子材料。尽管石墨烯具有良好的性能,但由于其图案和集成到标准器件制造工艺流程中的挑战,石墨烯尚未完全转变为主流电子材料。在这项研究中,研究人员开发了一种弹性体印章辅助剥离和转移方法,通过与重量约为30克或更少的聚二甲基硅氧烷(PDMS)印章接触,无缝地转移了图案化的石墨烯层。通过本文提出的方法,消除了石墨烯cvd生长过程中去除底层镍或铜前体的漫长湿法蚀刻周期。结果表明,该技术能够直接、无蚀刻地转移各种石墨烯图案,其尺寸可达~ 50µm,并且收率高。光学显微镜、扫描电镜(SEM)成像、原子力显微镜(AFM)和拉曼光谱对转移层的表征表明,在弹性图章辅助剥离和转移过程后,石墨烯的原始质量得到了保留,转移的石墨烯图案没有受到污染或损坏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Elastomeric Stamp-Assisted Exfoliation and Transfer of Patterned Graphene Layers
Graphene with its mechanical strength and superior electrical and thermal conductivity is an interesting material for microelectronics. Despite its favorable properties, graphene has not fully transitioned as a mainstream electronic material due to challenges involved in its patterning and integration to standard device fabrication process flows. In this study, an elastomeric stamp-assisted exfoliation and transfer approach has been developed, where patterned graphene layers were seamlessly transferred by contact with a polydimethylsiloxane (PDMS) stamp with an applied weight of ~ 30 grams or less. With the approach presented herein, lengthy wet etching cycles to remove the underlying nickel or copper precursors during CVD-growth of graphene have been eliminated. Results indicate that the proposed technique is capable of direct, etch-free transfer of various graphene patterns up to ~ 50 µm in size and with high yield. Optical microscopy, SEM imaging, atomic force microscopy (AFM), and Raman spectroscopy characterization of transferred layers demonstrate retainment of the pristine graphene quality after the elastomeric stamp-assisted exfoliation and transfer process with no contamination or damage on the transferred graphene patterns.
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