基于Web的第三代半导体微波器件产品成熟度评价系统

Gao Zhaofeng, Huang Jie, Zhang Kui
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引用次数: 0

摘要

针对第三代半导体微波器件产品成熟度水平评价的迫切需要和目前国内外评价方法的不足,从技术集成和技术维度对传统的技术成熟度水平(TRL)评价方法进行了全面扩展,建立了产品成熟度的结构化描述和测量模型;运用层次分析法(AHP)和属性数学,提出了基于问卷调查模式的定量计算方法,构建了基于Web的第三代半导体微波器件产品成熟度等级评价体系,最终客观有效地实现了对产品成熟度的全方位评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web
Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.
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