{"title":"基于Web的第三代半导体微波器件产品成熟度评价系统","authors":"Gao Zhaofeng, Huang Jie, Zhang Kui","doi":"10.1109/CCIENG.2011.6008111","DOIUrl":null,"url":null,"abstract":"Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.","PeriodicalId":6316,"journal":{"name":"2011 IEEE 2nd International Conference on Computing, Control and Industrial Engineering","volume":"35 1","pages":"243-246"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web\",\"authors\":\"Gao Zhaofeng, Huang Jie, Zhang Kui\",\"doi\":\"10.1109/CCIENG.2011.6008111\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.\",\"PeriodicalId\":6316,\"journal\":{\"name\":\"2011 IEEE 2nd International Conference on Computing, Control and Industrial Engineering\",\"volume\":\"35 1\",\"pages\":\"243-246\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 2nd International Conference on Computing, Control and Industrial Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCIENG.2011.6008111\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 2nd International Conference on Computing, Control and Industrial Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCIENG.2011.6008111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web
Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.