单晶纳米立方组成的黄铁矿(FeS2)薄膜中光载流子损耗的研究

RAN Pub Date : 2017-04-01 DOI:10.11159/ICNNFC17.118
Sudhanshu Shukla, T. Sritharan, Xiong Qihua, T. Sum, G. Xing, Nripan, Mathews, Hu Ge, T. Venkatesan, S. Mathew, Zhenghua Su, V. Nalla
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引用次数: 2

摘要

成功地从光活性材料中提取光激发载流子是光伏器件成功的关键。以前已经注意到以黄铁矿为活性层的器件所表现出的高损耗,但从未系统地研究过以了解光物理和载流子损耗机制以提高其性能。在这里,我们报告了用{100}终止的纯黄铁矿单晶纳米立方体制成的薄膜的详细表征。利用超快瞬态吸收光谱,我们发现光激发载流子快速定位到间接带边和浅阱态,特征衰减时间为1.8皮秒,然后弛豫到深阱态,捕获载流子重组,特征衰减时间为50-990纳秒。其光吸收特性与无序半导体有关。温度相关电阻率表现出Mott变跳程(VRH)型传导机制,与高密度缺陷态的存在一致。建立了一个具有中隙缺陷态的电子能带模型,可以解释所有观察到的现象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of Photocarrier Losses in Pyrite (FeS2) Film Consisting Single Crystal Nanocubes
Successful extraction of photo excited carriers from a photo active material is key towards a successful PV device. The high losses exhibited by a device with pyrite as the active layer has been noted previously but never investigated systematically to understand the photo physics and the carrier loss mechanisms to improve its performance. Here we report a detailed characterization of a film made using {100} terminated, pure pyrite single crystal nano cubes. Using ultrafast transient absorption spectroscopy we found fast carrier localization of photo excited carriers to indirect band edge and shallow trap states with characteristic decay time of 1.8 picoseconds, followed by relaxation to deep states and recombination of trapped carriers with long characteristic decay times of 50-990 nanoseconds. Its optical absorption characteristics correlate to a disordered semiconductor. Temperature dependent electrical resistivity exhibits a Mott variable range hopping (VRH) type conduction mechanism consistent with the presence of high density of defect states. An electron band model with midgap defect states is formulated that could explain all the observed phenomena.
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