利用STM32实现工艺参数的高速遥感

2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT) Pub Date : 2016-12-01 DOI:10.1109/ICAECCT.2016.7942611

S. Kedar, P. Saxena, Lekha Das

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引用次数: 0

摘要

在辐射探测器中，特别是在电离室中，过程参数的感知是信号读出的必要条件，电离室被广泛用于电离辐射通量的测量。提出的工作旨在描述一种先进的数据采集系统，用于精确测量参数。利用32位单片机STM32F401RE进行电离室数据采集，设计并开发了电离电流过程参数传感电路。

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High speed remote sensing of process parameters using STM32

Sensing process parameter is imperative for signal readout in radiation detectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizing radiations. The presented work aims to describe an advanced data acquisition system for accurate measurement of the parameters. A circuit is designed and developed for sensing process parameter that is ionization current using all in one 32-bit microcontroller STM32F401RE for ionization chamber data acquisition.

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2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)

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