有效的BIST用于互连串扰故障

T. Rudnicki, T. Garbolino, K. Gucwa, A. Hlawiczka
{"title":"有效的BIST用于互连串扰故障","authors":"T. Rudnicki, T. Garbolino, K. Gucwa, A. Hlawiczka","doi":"10.1109/DDECS.2009.5012120","DOIUrl":null,"url":null,"abstract":"The paper is devoted to a test-per-clock method of an length.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"6 1","pages":"164-169"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Effective BIST for crosstalk faults in interconnects\",\"authors\":\"T. Rudnicki, T. Garbolino, K. Gucwa, A. Hlawiczka\",\"doi\":\"10.1109/DDECS.2009.5012120\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper is devoted to a test-per-clock method of an length.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":\"6 1\",\"pages\":\"164-169\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012120\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012120","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

本文研究了一种长度为一个时钟的测试方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effective BIST for crosstalk faults in interconnects
The paper is devoted to a test-per-clock method of an length.
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