William Meiniel, P. Spinicelli, E. Angelini, A. Fragola, V. Loriette, F. Orieux, E. Sepúlveda, J. Olivo-Marin
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Reducing data acquisition for fast Structured Illumination Microscopy using Compressed Sensing
In this work, we introduce an original strategy to apply the Compressed Sensing (CS) framework to a super-resolution Structured Illumination Microscopy (SIM) technique. We first define a framework for direct domain CS, that exploits the sparsity of fluorescence microscopy images in the Fourier domain. We then propose an application of this method to a fast 4-images SIM technique, which allows to reconstruct super-resolved fluorescence microscopy images using only 25% of the camera pixels for each acquisition.
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