CMOS电路的非线性畸变分析

2014 International Semiconductor Conference (CAS) Pub Date : 2014-12-01 DOI:10.1109/SMICND.2014.6966452

M. Gurzun, L. Goras

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引用次数: 0

摘要

本通讯的目的是介绍在CMOS技术中实现的电路中有关非线性失真分析的一些方面。基本上，研究设想了总谐波失真(THD)的形状依赖于输入信号的幅度和频率。显然，上述函数对所研究电路的非线性行为提供了有趣的见解，值得进一步研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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On nonlinear distortions analysis of CMOS circuits

The aim of this communication is to present some aspects regarding nonlinear distortion analysis in circuits implemented in CMOS technology. Basically, the investigations envisage the shape of the total harmonic distortion (THD) dependence on the amplitude and frequency of the input signals. It is apparent that the above function gives interesting insight of the nonlinear behavior of the studied circuits and it is worth considering for further investigations.

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2014 International Semiconductor Conference (CAS)

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