利用改进的频谱反演技术进行介电常数剖面的电磁成像

Hyun-Chulchoi, Se-Yun Kim, J. Ra
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引用次数: 0

摘要

提出了一种通过增大离散化单元尺寸来改善逆散射问题的病态性的方法。为了观察更大单元离散化的效果,将一个24单元结构(0.1 lambda *0.1 lambda)划分为4个大单元(0.1 lambda *0.6 lambda)。对于X/sub 0/=0.3 lambda,分别通过24单元离散和4单元离散重建阶跃和连续介电常数曲线。4单元离散得到的结果非常接近原始介电剖面,但与24单元反演相比,计算时间大大减少,因为4单元离散的未知量从24>减少到12
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Electromagnetic imaging of permittivity profiles by an improved spectral inverse technique
A way to improve the ill-posedness of inverse scattering problems by making the cell size of the discretization much larger is proposed. In order to see the effect of the larger cell discretization, a 24-cell structure (0.1 lambda *0.1 lambda ) is divided into 4 large cells (0.1 lambda *0.6 lambda ). Step and continuous permittivity profiles are reconstructed by the 24-cell discretization and the 4-cell discretization, respectively, for X/sub 0/=0.3 lambda . The 4-cell discretization gives a result very close to the original dielectric profile, but the computation time is reduced significantly compared to the 24-cell inversion since the number of unknowns for 4-cell discretization is reduced to 12 from 24.<>
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