用于内存计算的畴壁磁隧道结自旋轨道转矩装置和电路

Mahshid Alamdar, Thomas Leonard, Can Cui, Bishweshwor P. Rimal, Lin Xue, Otitoaleke G. Akinola, T. Patrick Xiao, J. Friedman, C. Bennett, M. Marinella, J. Incorvia
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引用次数: 29

摘要

传统计算,特别是在完成数据密集型和实时任务方面存在着一些紧迫的问题,这促使内存计算设备的发展,以存储信息和执行计算。磁隧道结(MTJ)存储元件可以通过操纵磁畴壁(DW)进行计算,DW是磁畴之间的过渡区域。但是,这些器件面临着挑战:DW的自旋转移扭矩(STT)开关需要高电流,并且在DW轨道顶部创建MTJ柱所需的多个蚀刻步骤导致隧道磁阻(TMR)降低。这些问题限制了器件和电路的实验研究。在这里,我们研究了三端畴壁磁隧道结(DW-MTJ)内存计算器件的原型,该器件可以通过垂直磁各向异性(PMA)、自旋-轨道转矩(SOT)开关和优化的光刻工艺来解决数据处理瓶颈和解决这些挑战,从而产生平均器件隧道磁电阻TMR = 164%, resistance-area product RA = 31 {\Omega}-{\mu}m^2, close to the RA of the unpatterned film, and lower switching current density compared to using spin transfer torque. A two-device circuit shows bit propagation between devices. Device initialization variation in switching voltage is shown to be curtailed to 7% by controlling the DW initial position, which we show corresponds to 96% accuracy in a DW-MTJ full adder simulation. These results make strides in using MTJs and DWs for in-memory and neuromorphic computing applications.
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Domain wall-magnetic tunnel junction spin–orbit torque devices and circuits for in-memory computing
There are pressing problems with traditional computing, especially for accomplishing data-intensive and real-time tasks, that motivate the development of in-memory computing devices to both store information and perform computation. Magnetic tunnel junction (MTJ) memory elements can be used for computation by manipulating a domain wall (DW), a transition region between magnetic domains. But, these devices have suffered from challenges: spin transfer torque (STT) switching of a DW requires high current, and the multiple etch steps needed to create an MTJ pillar on top of a DW track has led to reduced tunnel magnetoresistance (TMR). These issues have limited experimental study of devices and circuits. Here, we study prototypes of three-terminal domain wall-magnetic tunnel junction (DW-MTJ) in-memory computing devices that can address data processing bottlenecks and resolve these challenges by using perpendicular magnetic anisotropy (PMA), spin-orbit torque (SOT) switching, and an optimized lithography process to produce average device tunnel magnetoresistance TMR = 164%, resistance-area product RA = 31 {\Omega}-{\mu}m^2, close to the RA of the unpatterned film, and lower switching current density compared to using spin transfer torque. A two-device circuit shows bit propagation between devices. Device initialization variation in switching voltage is shown to be curtailed to 7% by controlling the DW initial position, which we show corresponds to 96% accuracy in a DW-MTJ full adder simulation. These results make strides in using MTJs and DWs for in-memory and neuromorphic computing applications.
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