阵列处理中基于重采样的源检测技术

R. Brcich, A. Zoubir
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引用次数: 1

摘要

阵列处理中的源检测问题可以看作是对特征值相等性的检验。这种方法是通过一个多假设过程来实现的,该过程比较特征值之间的所有两两差异。重采样过程用于估计测试统计量的零分布,这对于小样本大小或非高斯信号是一个优势,因为传统技术(如最小描述长度(MDL))假设高斯性。仿真表明,对于小样本或非高斯信号,与MDL相比,该测试的性能有所提高,比更精确的球度测试有明显改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Resampling based techniques for source detection in array processing
The source detection problem in array processing can be considered as a test for the equality of eigenvalues. This approach is implemented through a multiple hypothesis procedure which compares all pairwise differences between eigenvalues. A resampling procedure is used to estimate the null distributions of the test statistics, an advantage for small sample sizes or non-Gaussian signals since traditional techniques such as the minimum description length (MDL) assume Gaussianity. Simulations show the increased performance of the test compared to the MDL for small samples or non-Gaussian signals, with a noticeable improvement over the more accurate sphericity test.
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期刊介绍: Journal of Signal Processing is an academic journal supervised by China Association for Science and Technology and sponsored by China Institute of Electronics. The journal is an academic journal that reflects the latest research results and technological progress in the field of signal processing and related disciplines. It covers academic papers and review articles on new theories, new ideas, and new technologies in the field of signal processing. The journal aims to provide a platform for academic exchanges for scientific researchers and engineering and technical personnel engaged in basic research and applied research in signal processing, thereby promoting the development of information science and technology. At present, the journal has been included in the three major domestic core journal databases "China Science Citation Database (CSCD), China Science and Technology Core Journals (CSTPCD), Chinese Core Journals Overview" and Coaj. It is also included in many foreign databases such as Scopus, CSA, EBSCO host, INSPEC, JST, etc.
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