基于太赫兹发射振幅的Fe/Pt自旋电子异质结构中Fe厚度分布的二维映射

2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Pub Date : 2020-11-08 DOI:10.1109/IRMMW-THz46771.2020.9370658

Y. Koike, S. Tetsukawa, M. Nishitani, H. Kitahara, V. Mag-usara, M. Asakawa, M. Yoshimura, M. Tani, M. Nakajima

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引用次数: 0

摘要

我们证明了基于大面积自旋电子异质结构的太赫兹发射振幅在二维上映射金属层厚度剖面的可行性。通过磁控溅射，在玻璃基板上沉积了一层Fe/Pt双层膜，使得直径为100mm的圆形空间被4nm的Pt覆盖，并具有0.5 nm至7nm厚度的梯度。通过二维振幅映射，在一个样品中清楚地观察到自旋电子太赫兹辐射的铁厚度依赖性。

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Terahertz emission amplitude-based 2D mapping of the Fe thickness profile in Fe/Pt spintronic heterostructure

We demonstrate the feasibility of mapping metallic layer thickness profile in 2 dimension based on the amplitude of the terahertz emission of a large area spintronic heterostructure. A Fe/Pt bilayer was deposited on glass substrate such that a 100 mm diameter circular space was covered with 4 nm Pt throughout and with a gradient of 0.5 nm to 7 nm thick Fe by magnetron sputtering. The Fe thickness dependence of the spintronic THz emission is clearly observed in just one sample by two-dimensional amplitude mapping.

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2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

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