热剥落和热冲击条件下中央测量罩下封头应力分析

Shu Zheng, D. Lu, Q. Cao
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摘要

在钠冷快堆(SFR)中,中央测量罩作为一个重要的容器内部件,对控制棒和测量设备起引导和保护作用。中央测量罩(LHCMS)的下封头位于岩心出口上方,距岩心出口仅500mm。因此,LHCMS长期受到堆芯出口液钠的影响,特别是以下两种温度效应。一方面,堆芯功率分布不均匀导致堆芯热条化现象,可能导致高周疲劳甚至初始裂纹;另一方面,在停堆工况下,由于堆芯功率的降低,堆芯出口处的冷却液温度急剧降低,诱发热冲击现象,可能造成较大的热应力和低周疲劳。因此,对热条带化和热冲击条件下的LHCMS进行应力和疲劳分析是非常必要的。本文首先建立了LHCMS的有限元模型,然后根据热条形条件和热冲击条件下的温度曲线,对LHCMS的热应力进行了模拟。结果表明:虽然LHCMS外温度波动较大,但热条化引起的应力仅在123MPa水平上有轻微波动,最大应力范围为11MPa;此外,在20s时,热条带和热冲击条件存在最大应力差,热冲击引起的最大应力比热条带引起的最大应力大3倍左右。根据高周和低周疲劳分析,热条带的疲劳损伤系数仅为0.0078,而热冲击的疲劳损伤系数为3.416,可为LHCMS的设计提供参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Stress Analysis of the Lower Head of Central Measuring Shroud Under Thermal Striping and Thermal Shock Conditions
The central measuring shroud, as an important in-vessel component, provides guidance and protection for control rods and measuring equipment in a sodium-cooled fast reactor (SFR). The lower head of central measuring shroud (LHCMS), which is located above the core outlet, is only 500mm away from the core outlet. Therefore, the LHCMS is affected by the liquid sodium from core outlet for a long period, especially the temperature effects of the following two types. On the one hand, under the operating condition of the SFRs, the uneven distribution of the core power causes the phenomenon of thermal striping, which may cause high cycle fatigue and even initial crack. On the other hand, under the scram condition, the coolant temperature at the core outlet is sharply reduced due to the decrease of the core power, inducing the phenomenon of thermal shock that may cause large thermal stress and low cycle fatigue. Therefore, stress and fatigue analyses of the LHCMS under the thermal striping and thermal shock conditions are very necessary. In the paper, finite element model of the LHCMS was first established, and then according to the temperature curves under thermal striping conditions and thermal shock conditions, the thermal stress of the LHCMS was simulated. The results showed that although the temperature fluctuation outside the LHCMS is severe, the stress caused by thermal striping only slightly fluctuates at 123MPa level, the maximum stress range is 11MPa. Besides, at 20s, there exists the maximum stress difference between thermal striping and thermal shock conditions, the maximum stress caused by thermal shock is about 3 time larger than that caused by thermal striping. According to high cycle and low cycle fatigue analyses, the fatigue damage factor of thermal striping is only 0.0078, while the fatigue damage factor of thermal shock is 3.416, which should provide a reference for the design of the LHCMS.
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