24ghz无损微波检测近场聚焦理论与实验验证

Christian Ziehm , Sebastian Hantscher , Johann Hinken , Christian Ziep , Maik Richter
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引用次数: 4

摘要

本文介绍了为提高24 GHz微波无损检测(NDT)的空间分辨率而发展的各种新型天线概念。在许多应用中,传感器的天线可以非常靠近被测设备。在这些情况下,天线的近场特性对于高分辨率至关重要。然而,普通的传感器头提供高图像分辨率或高穿透深度。为了结合这两种特性,不同的天线概念被开发出来。目标是获得高回波损耗,同时具有足够的高动态范围和电磁波的近场聚焦,从而获得高分辨率。总共设置了三个天线。对每个天线进行了解析计算,然后进行了有限元模拟、近场测量和实验验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Near field focusing for nondestructive microwave testing at 24 GHz – Theory and experimental verification

This paper describes the development of different novel antenna concepts for improving the spatial resolution of microwave based non-destructive testing (NDT) at 24 GHz. In a great number of applications the antenna of the sensor can be brought very close to the device under test. In these cases, the near field characteristics of the antennas are crucial for a high resolution. However, common sensor heads offer either a high image resolution or a high penetration depth. In order to combine both of the characteristics different antenna concepts have been developed. The objectives were to obtain a high return loss combined with a sufficient high dynamic range and a near field focusing of electromagnetic waves in order to yield a high resolution. Altogether, three antennas have been set up. Each antenna has been calculated analytically, followed by a FEM simulation, near field measurements and an experimental verification.

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