ISSTA '20:第29届ACM SIGSOFT软件测试与分析国际研讨会，虚拟事件，美国，2020年7月18-22日

{"title":"ISSTA '20:第29届ACM SIGSOFT软件测试与分析国际研讨会，虚拟事件，美国，2020年7月18-22日","authors":"","doi":"10.1145/3395363","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20624,"journal":{"name":"Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis","volume":"9 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"ISSTA '20: 29th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, USA, July 18-22, 2020\",\"authors\":\"\",\"doi\":\"10.1145/3395363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":20624,\"journal\":{\"name\":\"Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis\",\"volume\":\"9 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3395363\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3395363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}