多维计算机断层扫描中多材料部件表面测定过程的实验研究

Fabrício Borges de Oliveira , Alessandro Stolfi , Markus Bartscher , Leonardo De Chiffre , Ulrich Neuschaefer-Rube
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引用次数: 38

摘要

测量多材料组分,同时评估内部和外部特征的可能性使x射线计算机断层扫描(CT)成为坐标测量系统(cms)领域的最新发展。然而,选择合适的扫描参数和合适的表面测定设置的困难,限制了CT作为CMS的更好接受。此外,标准CT用户受制于使用商业分析软件所隐含的算法和边界条件。在此背景下,本文使用商用CT数据分析软件Volume Graphics VGStudio Max 2.2.6中提供的功能,对表面测定过程对多材料测量的影响进行实验评估。以不同材料(PEEK, PPS, Al)制成的校准步长计作为参考标准。阶梯式测量仪以不同的多材料x射线吸收比的方式组装。对单材料组件进行了比较测量。考虑了不同的分割过程(例如ISO-50%,局部阈值,区域增长等),进行了基于补丁的双向长度分析,以对组件进行材料内测量。这项工作讨论了基于真实CT扫描的不同方法,旨在为多材料测量的分割过程提供建议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental investigation of surface determination process on multi-material components for dimensional computed tomography

The possibility of measuring multi-material components, while assessing inner and outer features simultaneously makes X-ray computed tomography (CT) the latest evolution in the field of coordinate measurement systems (CMSs).

However, the difficulty in selecting suitable scanning parameters and suitable surface determination settings, limits a better acceptance of CT as a CMS. Moreover, standard CT users are subject to the algorithms and boundary conditions implied by the use of commercial analysis software.

In this context, this paper is concerned with the experimental evaluation of the influence of surface determination process on multi-material measurements, using functions available in the commercial CT data analysis software Volume Graphics VGStudio Max 2.2.6.

Calibrated step gauges made of different materials, i.e. PEEK, PPS, and Al were used as reference standards. The step gauges were assembled in such a way as to have different multi-material X-ray absorption ratios. Comparative measurements of mono-material assemblies were performed as well. Different segmentation processes were considered (e.g. ISO-50%, local threshold, region growing, etc.), patch-based bidirectional length analyses were carried out to perform in-material measurements on the assemblies.

This work discusses the different approaches based on real CT scans, and aims to provide advice on the segmentation process for multi-material measurements.

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