先进的封装技术,降低成本,高耐用性和显著提高可制造性

K. Barth, James Morgante, W. Sampath, T. Shimpi, Larry Maple
{"title":"先进的封装技术,降低成本,高耐用性和显著提高可制造性","authors":"K. Barth, James Morgante, W. Sampath, T. Shimpi, Larry Maple","doi":"10.1109/PVSC.2018.8548213","DOIUrl":null,"url":null,"abstract":"A recent detailed analysis was performed by DOE and NREL [1] that identified avenues needed to lower solar LCOE. Two key areas are identified: reduce module costs and improved module reliably and lifetime. The NREL/DOE study found that for both crystalline silicon (c-Si) and thin film PV, the encapsulation and module assembly costs were the largest single cost category for manufacturing. The capital equipment (cap-ex) costs for the module assembly are also shown to be high. Current module designs have opportunities for reliably improvements. Studies of fielded modules by NREL have shown degradation of over 1.8%/yr. Reducing degradation to 0.2%/yr. while increasing module lifetime will facilitate further cost reductions. Supported by the US Dept. of Energy’s PVRD program, Colorado State University’s Next Generation PV Center is developing a new module architecture and associated manufacturing processes to reduce costs and improve reliably.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"21 1","pages":"0557-0560"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Advanced Encapsulation Technology for Reduced Costs, High Durability and Significantly Improved Manufacturability\",\"authors\":\"K. Barth, James Morgante, W. Sampath, T. Shimpi, Larry Maple\",\"doi\":\"10.1109/PVSC.2018.8548213\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A recent detailed analysis was performed by DOE and NREL [1] that identified avenues needed to lower solar LCOE. Two key areas are identified: reduce module costs and improved module reliably and lifetime. The NREL/DOE study found that for both crystalline silicon (c-Si) and thin film PV, the encapsulation and module assembly costs were the largest single cost category for manufacturing. The capital equipment (cap-ex) costs for the module assembly are also shown to be high. Current module designs have opportunities for reliably improvements. Studies of fielded modules by NREL have shown degradation of over 1.8%/yr. Reducing degradation to 0.2%/yr. while increasing module lifetime will facilitate further cost reductions. Supported by the US Dept. of Energy’s PVRD program, Colorado State University’s Next Generation PV Center is developing a new module architecture and associated manufacturing processes to reduce costs and improve reliably.\",\"PeriodicalId\":6558,\"journal\":{\"name\":\"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)\",\"volume\":\"21 1\",\"pages\":\"0557-0560\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2018.8548213\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2018.8548213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

美国能源部和NREL最近进行了一项详细分析[1],确定了降低太阳能LCOE所需的途径。确定了两个关键领域:降低模块成本,提高模块的可靠性和使用寿命。NREL/DOE的研究发现,对于晶体硅(c-Si)和薄膜光伏来说,封装和组件组装成本是制造中最大的单一成本类别。模组组装的资本设备成本也很高。当前的模块设计有可靠改进的机会。NREL对现场模块的研究表明,降解率超过每年1.8%。降低降解至0.2%/年。而增加模块寿命将有助于进一步降低成本。在美国能源部PVRD项目的支持下,科罗拉多州立大学的下一代光伏中心正在开发一种新的模块架构和相关的制造工艺,以降低成本并提高可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advanced Encapsulation Technology for Reduced Costs, High Durability and Significantly Improved Manufacturability
A recent detailed analysis was performed by DOE and NREL [1] that identified avenues needed to lower solar LCOE. Two key areas are identified: reduce module costs and improved module reliably and lifetime. The NREL/DOE study found that for both crystalline silicon (c-Si) and thin film PV, the encapsulation and module assembly costs were the largest single cost category for manufacturing. The capital equipment (cap-ex) costs for the module assembly are also shown to be high. Current module designs have opportunities for reliably improvements. Studies of fielded modules by NREL have shown degradation of over 1.8%/yr. Reducing degradation to 0.2%/yr. while increasing module lifetime will facilitate further cost reductions. Supported by the US Dept. of Energy’s PVRD program, Colorado State University’s Next Generation PV Center is developing a new module architecture and associated manufacturing processes to reduce costs and improve reliably.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信