银金属氧化物触点材料开关性能的比较

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 1993-09-27 DOI:10.1109/HOLM.1993.489658

D. McDonnell, J. Gardener, J. Gondusky

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引用次数: 10

摘要

对内部氧化的氧化镉银和氧化锡银、氧化铟接触材料的开关行为进行了调查，其中详细的、计算机支持的性能变化分析(接触焊接力、电阻和温度变化)进行了评估。此外，还研究了电开关对材料物理特性(接触侵蚀和表面形貌)的影响。氧化银锡铟材料的抗侵蚀性能明显高于氧化银镉材料。焊接电阻以及电阻和温度的变化具有可比性，并且更多地取决于氧化物水平而不是材料。结果表明，内氧化银锡、氧化铟可作为内氧化银镉氧化物的无毒替代品。

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Comparison of the switching behavior of silver metal oxide contact materials

An investigation of the switching behavior of internally oxidized silver cadmium oxide and silver tin, indium oxide contact materials was undertaken in which detailed, computer supported analysis of changes in the performance (contact weld force, electrical resistance and temperature change) was evaluated. In addition, the impact of electrical switching on the physical characteristics of the material (contact erosion and surface morphology) was examined. The silver tin, indium oxide materials exhibited significantly higher resistance to erosion than the silver cadmium oxide materials. The resistance to welding as well as changes to electrical resistance and temperature were comparable and were more dependent on oxide level than on materials. The results suggest that internally oxidized silver tin, indium oxide could serve as a nontoxic replacement for internally oxidized silver cadmium oxide.

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Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts

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