{"title":"闪光和折叠A/D转换器的最佳偏移平均","authors":"O. Carnu, A. Leuciuc","doi":"10.1109/ISCAS.2004.1328149","DOIUrl":null,"url":null,"abstract":"Resistive networks can be used as spatial filters to average the random errors in arrays of analog cells, specifically for decreasing the offsets in flash and folding A/D converters. In this communication the critical conditions the averaging networks have to satisfy are pointed out and the optimal topology, order, and parameters of the resistive grids are identified for each of the two ADC architectures.","PeriodicalId":6445,"journal":{"name":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","volume":"1 1","pages":"I-I"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Optimal offset averaging for flash and folding A/D converters\",\"authors\":\"O. Carnu, A. Leuciuc\",\"doi\":\"10.1109/ISCAS.2004.1328149\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Resistive networks can be used as spatial filters to average the random errors in arrays of analog cells, specifically for decreasing the offsets in flash and folding A/D converters. In this communication the critical conditions the averaging networks have to satisfy are pointed out and the optimal topology, order, and parameters of the resistive grids are identified for each of the two ADC architectures.\",\"PeriodicalId\":6445,\"journal\":{\"name\":\"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)\",\"volume\":\"1 1\",\"pages\":\"I-I\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISCAS.2004.1328149\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2004.1328149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimal offset averaging for flash and folding A/D converters
Resistive networks can be used as spatial filters to average the random errors in arrays of analog cells, specifically for decreasing the offsets in flash and folding A/D converters. In this communication the critical conditions the averaging networks have to satisfy are pointed out and the optimal topology, order, and parameters of the resistive grids are identified for each of the two ADC architectures.