平面多模波导中的微分干涉

Journal De Physique Iv Pub Date : 2006-11-01 DOI:10.1051/JP4:2006137017

K. Gut

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引用次数: 4

摘要

本文介绍了一种平面差分波导干涉仪的研究结果。波导折射率的变化导致同阶正交模之间的相位差，导致传感器出口光的偏振状态发生变化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Differential interference in planar multimode waveguides

The paper presents the results of investigations on a planar differential waveguide interferometer. Changes of the refraction index of the waveguide covert result in phase differences between the ortogonal modes of the same order, causing changes in the state of polarisation of the light at the outlet of the sensor.

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Journal De Physique Iv

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