电弧故障检测与判别方法

C. Restrepo
{"title":"电弧故障检测与判别方法","authors":"C. Restrepo","doi":"10.1109/HOLM.2007.4318203","DOIUrl":null,"url":null,"abstract":"Arc waveform characteristics can be evaluated with various methods to recognize the presence of hazardous arc fault conditions. Discussion covers the arc phenomena and how it is generated in a low voltage electrical distribution circuit, as well as the isolation of the presence of hazardous conditions versus conditions that could falsely mimic the presence of an arc fault. Many waveform characteristics and conditions support the detection of hazardous arc faults and foster a more robust design, capable of withstanding unwanted tripping conditions.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"2 1","pages":"115-122"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"92","resultStr":"{\"title\":\"Arc Fault Detection and Discrimination Methods\",\"authors\":\"C. Restrepo\",\"doi\":\"10.1109/HOLM.2007.4318203\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Arc waveform characteristics can be evaluated with various methods to recognize the presence of hazardous arc fault conditions. Discussion covers the arc phenomena and how it is generated in a low voltage electrical distribution circuit, as well as the isolation of the presence of hazardous conditions versus conditions that could falsely mimic the presence of an arc fault. Many waveform characteristics and conditions support the detection of hazardous arc faults and foster a more robust design, capable of withstanding unwanted tripping conditions.\",\"PeriodicalId\":11624,\"journal\":{\"name\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"volume\":\"2 1\",\"pages\":\"115-122\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"92\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2007.4318203\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 92

摘要

电弧波形特征可以用各种方法来评估,以识别危险电弧故障条件的存在。讨论涵盖了电弧现象及其如何在低压配电电路中产生,以及危险条件与可能错误地模拟电弧故障存在的条件的隔离。许多波形特征和条件支持危险电弧故障的检测,并促进更强大的设计,能够承受不必要的跳闸条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Arc Fault Detection and Discrimination Methods
Arc waveform characteristics can be evaluated with various methods to recognize the presence of hazardous arc fault conditions. Discussion covers the arc phenomena and how it is generated in a low voltage electrical distribution circuit, as well as the isolation of the presence of hazardous conditions versus conditions that could falsely mimic the presence of an arc fault. Many waveform characteristics and conditions support the detection of hazardous arc faults and foster a more robust design, capable of withstanding unwanted tripping conditions.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信