1550 nm硅光子学中应变工程MoTe2光电探测器

R. Maiti, C. Patil, T. Xie, Javad G. Azadani, R. Amin, M. Miscuglio, D. van Thourhout, T. Low, S. Bank, V. Sorger
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引用次数: 0

摘要

在这里,我们展示了应变工程(~ 4%拉伸应变)如何降低MoTe2纳米晶体在硅光子波导周围异质集成的带隙(- 0.2eV),从而实现1550nm的光吸收,响应率为0.5A/W, NEP为90pW/Hz2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Strain-Engineered MoTe2 Photodetector in Silicon Photonics at 1550 nm
Here we show how strain-engineering (∼4% tensile strain) lowers the bandgap (−0.2eV) of MoTe2 nanocrystals heterogeneously integrated around a silicon photonic waveguide, thus enabling photoabsorption at 1550nm, a responsivity of 0.5A/W and NEP of 90pW/Hz2.
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