{"title":"偏光计:贝西2号的软x射线8轴uhv衍射仪","authors":"A. Sokolov, F. Schäfers","doi":"10.17815/JLSRF-2-90","DOIUrl":null,"url":null,"abstract":"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements.","PeriodicalId":16282,"journal":{"name":"Journal of large-scale research facilities JLSRF","volume":"9 1","pages":"92"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"POLARIMETER: A Soft X-Ray 8-Axis UHV-Diffractometer at BESSY II\",\"authors\":\"A. Sokolov, F. Schäfers\",\"doi\":\"10.17815/JLSRF-2-90\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements.\",\"PeriodicalId\":16282,\"journal\":{\"name\":\"Journal of large-scale research facilities JLSRF\",\"volume\":\"9 1\",\"pages\":\"92\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of large-scale research facilities JLSRF\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17815/JLSRF-2-90\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of large-scale research facilities JLSRF","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17815/JLSRF-2-90","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
POLARIMETER: A Soft X-Ray 8-Axis UHV-Diffractometer at BESSY II
A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements.