利用窗口对封装互连进行精确分析

W. Beyene, Xingchao Yuan
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引用次数: 0

摘要

要对封装互连进行精确的瞬态分析,需要对导体和介电损耗以及3D结构的其他高频效应进行建模和分析。在频域更精确地模拟了互连的趋肤效应和色散。因此,这样一个系统的完整的时域模拟只能使用卷积技术。虽然卷积方法被很好地理解,但窗在互连分析中的应用却很少。在本文中,我们提出了窗口选择的实际考虑因素及其在提高卷积模拟器精度方面的应用。我们引入了Tukey窗口,并研究了如何平滑地将基准设置为零以避免混叠和抑制波纹,以及为了获得有意义的结果,在窗口边缘将折让多少信息。并比较了Tukey窗口和其他常用窗口的限带效果。最后,分别利用仿真和测量得到的散射参数对线键PBGA封装和pcb -连接器系统进行了分析,验证了该方法的有效性和准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the use of windows for accurate analysis of package interconnects
An accurate transient analysis of a package interconnect requires the modeling and analysis of conductor and dielectric losses, as well as other high-frequency effects of 3D structures. The skin effect and dispersion of interconnects are more accurately modeled in frequency domain. Consequently, the complete time-domain simulation of such a system is only possible using convolution techniques. Although the convolution method is well understood, the application of windowing for interconnect analysis is less so. In this paper, we present the practical considerations of window selection and its application to improve the accuracy of convolution simulators. We introduce the Tukey window and study the tradeoff between how smoothly a datum can be set to zero to avoid aliasing and suppress ripples and how much information tapering will discount at the edge of the window in order to obtain meaningful results. The bandlimiting effects of the Tukey window and other well-known windows are also compared. Finally, wirebond PBGA package and PCB-connector system are analyzed using the scattering parameters obtained from simulation and measurement, respectively, to verify the validity and accuracy of the method.
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