一个测试套件Diagnosability标准谱故障定位方法

Alexandre Perez, Rui Abreu, A. Deursen
{"title":"一个测试套件Diagnosability标准谱故障定位方法","authors":"Alexandre Perez, Rui Abreu, A. Deursen","doi":"10.1109/ICSE.2017.66","DOIUrl":null,"url":null,"abstract":"Current metrics for assessing the adequacy of a test-suite plainly focus on the number of components (be it lines, branches, paths) covered by the suite, but do not explicitly check how the tests actually exercise these components and whether they provide enough information so that spectrum-based fault localization techniques can perform accurate fault isolation. We propose a metric, called DDU, aimed at complementing adequacy measurements by quantifying a test-suite's diagnosability, i.e., the effectiveness of applying spectrum-based fault localization to pinpoint faults in the code in the event of test failures. Our aim is to increase the value generated by creating thorough test-suites, so they are not only regarded as error detection mechanisms but also as effective diagnostic aids that help widely-used fault-localization techniques to accurately pinpoint the location of bugs in the system. Our experiments show that optimizing a test suite with respect to DDU yields a 34% gain in spectrum-based fault localization report accuracy when compared to the standard branch-coverage metric.","PeriodicalId":6505,"journal":{"name":"2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)","volume":"17 1","pages":"654-664"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"66","resultStr":"{\"title\":\"A Test-Suite Diagnosability Metric for Spectrum-Based Fault Localization Approaches\",\"authors\":\"Alexandre Perez, Rui Abreu, A. Deursen\",\"doi\":\"10.1109/ICSE.2017.66\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Current metrics for assessing the adequacy of a test-suite plainly focus on the number of components (be it lines, branches, paths) covered by the suite, but do not explicitly check how the tests actually exercise these components and whether they provide enough information so that spectrum-based fault localization techniques can perform accurate fault isolation. We propose a metric, called DDU, aimed at complementing adequacy measurements by quantifying a test-suite's diagnosability, i.e., the effectiveness of applying spectrum-based fault localization to pinpoint faults in the code in the event of test failures. Our aim is to increase the value generated by creating thorough test-suites, so they are not only regarded as error detection mechanisms but also as effective diagnostic aids that help widely-used fault-localization techniques to accurately pinpoint the location of bugs in the system. Our experiments show that optimizing a test suite with respect to DDU yields a 34% gain in spectrum-based fault localization report accuracy when compared to the standard branch-coverage metric.\",\"PeriodicalId\":6505,\"journal\":{\"name\":\"2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)\",\"volume\":\"17 1\",\"pages\":\"654-664\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"66\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSE.2017.66\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSE.2017.66","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 66

摘要

当前用于评估测试套件的充分性的度量明确地关注套件所覆盖的组件(无论是行、分支还是路径)的数量,但是没有明确地检查测试实际上是如何运行这些组件的,以及它们是否提供了足够的信息,以便基于谱的故障定位技术能够执行准确的故障隔离。我们提出了一个称为DDU的度量,旨在通过量化测试套件的可诊断性来补充充分性度量,即,在测试失败的情况下,应用基于谱的故障定位来精确定位代码中的故障的有效性。我们的目标是通过创建完整的测试套件来增加产生的价值,因此它们不仅被视为错误检测机制,而且还被视为有效的诊断辅助工具,可以帮助广泛使用的故障定位技术准确地确定系统中错误的位置。我们的实验表明,与标准分支覆盖度量相比,针对DDU优化测试套件在基于频谱的故障定位报告准确性方面获得了34%的增益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Test-Suite Diagnosability Metric for Spectrum-Based Fault Localization Approaches
Current metrics for assessing the adequacy of a test-suite plainly focus on the number of components (be it lines, branches, paths) covered by the suite, but do not explicitly check how the tests actually exercise these components and whether they provide enough information so that spectrum-based fault localization techniques can perform accurate fault isolation. We propose a metric, called DDU, aimed at complementing adequacy measurements by quantifying a test-suite's diagnosability, i.e., the effectiveness of applying spectrum-based fault localization to pinpoint faults in the code in the event of test failures. Our aim is to increase the value generated by creating thorough test-suites, so they are not only regarded as error detection mechanisms but also as effective diagnostic aids that help widely-used fault-localization techniques to accurately pinpoint the location of bugs in the system. Our experiments show that optimizing a test suite with respect to DDU yields a 34% gain in spectrum-based fault localization report accuracy when compared to the standard branch-coverage metric.
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