二十面体AlMnSi的结晶

David V. Baxter, R. Schulz, G.J.C. Carpenter, J.O. Strom-Olsen
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引用次数: 1

摘要

采用电阻率测量、扫描量热法、电子显微镜和x射线衍射等方法研究了二十面体(Al0.786Mn0214100−x6)在x = 2、4和6时的结晶特性。我们发现,晶化的第一阶段是二元AlMn T相的形成,即使二十面体相中含有硅。这种成分的纺丝带总是含有少量的氟化铝,它与T相的形成同时进入溶液,产生样品电阻的急剧增加,从670 K附近开始。根据样品中硅的浓度不同,最终结晶产物为β-Al9Mn3Si和λ-Al4Mn、Al6Mn或α-Al9Mn2Si1.8。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Crystallization of icosahedral AlMnSi

The crystallization characteristics of icosahedral (Al0.786Mn0214100−xSix were studied for x = 2, 4, and 6 using resistivity measurements, scanning calorimetry, electron microscopy and X-ray diffraction. We find that the first stage in the crystallization is the formation of the binary AlMn T phase even when the icosahedral phase contains silicon. As-spun ribbons of this composition invariably contain a small amount of f.c.c. aluminium which goes into solution concurrently with the formation of the T phase, producing a dramatic increase in the sample resistance, starting near 670 K. The final crystallization products are β-Al9Mn3Si and either λ-Al4Mn, Al6Mn or α-Al9Mn2Si1.8, depending on the concentration of silicon in the sample.

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