{"title":"任务剖面对全电动飞机辐射失效影响的研究综述","authors":"L. Fauth, J. Friebe","doi":"10.1109/ESARS-ITEC57127.2023.10114905","DOIUrl":null,"url":null,"abstract":"Radiation induced failures of power semiconduc-tors are one of the largest challenges in realizing all-electric aircraft. Both the high flight altitude and the large total chip area resulting from the high power requirements will massively increase the failure rate compared to ground applications of power electronics systems. This paper gives an overview on the mechanism of radiation-induced failures and illustrates the effect of different mission profiles on the failure rate.","PeriodicalId":38493,"journal":{"name":"AUS","volume":"15 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Overview on the Effects of Mission Profiles on Radiation Induced Failures in All-Electric Aircraft\",\"authors\":\"L. Fauth, J. Friebe\",\"doi\":\"10.1109/ESARS-ITEC57127.2023.10114905\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiation induced failures of power semiconduc-tors are one of the largest challenges in realizing all-electric aircraft. Both the high flight altitude and the large total chip area resulting from the high power requirements will massively increase the failure rate compared to ground applications of power electronics systems. This paper gives an overview on the mechanism of radiation-induced failures and illustrates the effect of different mission profiles on the failure rate.\",\"PeriodicalId\":38493,\"journal\":{\"name\":\"AUS\",\"volume\":\"15 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AUS\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESARS-ITEC57127.2023.10114905\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AUS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESARS-ITEC57127.2023.10114905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
Overview on the Effects of Mission Profiles on Radiation Induced Failures in All-Electric Aircraft
Radiation induced failures of power semiconduc-tors are one of the largest challenges in realizing all-electric aircraft. Both the high flight altitude and the large total chip area resulting from the high power requirements will massively increase the failure rate compared to ground applications of power electronics systems. This paper gives an overview on the mechanism of radiation-induced failures and illustrates the effect of different mission profiles on the failure rate.
期刊介绍:
Revista AUS es una publicación académica de corriente principal perteneciente a la comunidad de investigadores de la arquitectura y el urbanismo sostenibles, en el ámbito de las culturas locales y globales. La revista es semestral, cuenta con comité editorial y sus artículos son revisados por pares en el sistema de doble ciego. Periodicidad semestral.