双极微电路学习实验方法

2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI) Pub Date : 2017-09-01 DOI:10.1109/icpcsi.2017.8391836

S. Tyulevin, M. Piganov, E. Erantseva

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引用次数: 0

摘要

对半导体微电路学习实验中质量指标的个体预测方法进行了分析。给出了信息参数及其控制方法的选择。在研究试验过程中引入微电路的方案和控制方式是合理的。对微电路的构造技术变体进行了分析。制定了一项研究测试计划。给出了522系列单片机的训练实验结果。对实验数据进行了分析。该训练实验的结果可用于构建微电路质量的数学预测模型。

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Methods of the learning experiment of bipolar microcircuits

The analysis of methods of the learning experiment of semiconductor microcircuits for individual forecasting of indicators of their quality has been carried out. The choice of informative parameters and means of their control has been made. The schemes of the inclusion of microcircuits in the process of research tests and the modes of their control has been justified. The analysis of constructive-technological variants of microcircuits has been carried out. A program of research tests has been developed. The results of the training experiment for microchips of the 522 series has been presented. The analysis of the experimental data has been carried out. The results of the training experiment for constructing mathematical predictive models of the quality of microcircuits has been recommended to use.

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来源期刊

2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI)

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