N. Bailly, E. Djurado, S. Georges
{"title":"基于微电极校准方法的薄膜电特性研究","authors":"N. Bailly, E. Djurado, S. Georges","doi":"10.1149/2.029204ESL","DOIUrl":null,"url":null,"abstract":"A method allowing the electrical characterization of ionic conducting films is described. This method is based on the calibration of the electrically active surface of a platinum micro-electrode. This method allows a significant decrease of instrumental or parasitic effects, the observation of dielectric relaxations at high temperature, the characterization of imperfectly tight layers, and gives an alternative to paint or sputtered Pt layer current collectors. © 2012 The Electrochemical Society. [DOI: 10.1149/2.029204esl] All rights reserved.","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"20 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Electrical Characterization of Thin Films by an Original Micro-Electrode Calibration Method\",\"authors\":\"N. Bailly, E. Djurado, S. Georges\",\"doi\":\"10.1149/2.029204ESL\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method allowing the electrical characterization of ionic conducting films is described. This method is based on the calibration of the electrically active surface of a platinum micro-electrode. This method allows a significant decrease of instrumental or parasitic effects, the observation of dielectric relaxations at high temperature, the characterization of imperfectly tight layers, and gives an alternative to paint or sputtered Pt layer current collectors. © 2012 The Electrochemical Society. [DOI: 10.1149/2.029204esl] All rights reserved.\",\"PeriodicalId\":11627,\"journal\":{\"name\":\"Electrochemical and Solid State Letters\",\"volume\":\"20 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrochemical and Solid State Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1149/2.029204ESL\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrochemical and Solid State Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1149/2.029204ESL","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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