CMOS集成电路中串扰对逻辑单元延迟的影响分析

F. Moll, E. Isern, E. Sicard, A. Rubio
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引用次数: 4

摘要

显示了具有并发转换的信号之间的串扰耦合如何导致连接到它们的CMOS逻辑单元的传播延迟显著增加或减少。提出了一种简化的寄生电容耦合模型,并评估了电池参数对内延迟的影响。作为一个应用实例,作者分析了由于串扰引起的延时增大如何引起RS锁存电路的永久逻辑故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of cross-talk effects on logic cell delays in CMOS integrated circuits
Shows how crosstalk coupling between signals with concurrent transitions can cause a significant increase in or a reduction of the propagation delay of CMOS logic cells connected to them. A reduced model for parasitic capacitive coupling is proposed, and the influence of electrical cell parameters on the internal delay is evaluated. As an application example, the authors analyze how an enlarged delay due to crosstalk can cause permanent logic faults in RS latch circuits.<>
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