{"title":"CMOS集成电路中串扰对逻辑单元延迟的影响分析","authors":"F. Moll, E. Isern, E. Sicard, A. Rubio","doi":"10.1109/MWSCAS.1991.252178","DOIUrl":null,"url":null,"abstract":"Shows how crosstalk coupling between signals with concurrent transitions can cause a significant increase in or a reduction of the propagation delay of CMOS logic cells connected to them. A reduced model for parasitic capacitive coupling is proposed, and the influence of electrical cell parameters on the internal delay is evaluated. As an application example, the authors analyze how an enlarged delay due to crosstalk can cause permanent logic faults in RS latch circuits.<<ETX>>","PeriodicalId":6453,"journal":{"name":"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems","volume":"34 1","pages":"387-390 vol.1"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Analysis of cross-talk effects on logic cell delays in CMOS integrated circuits\",\"authors\":\"F. Moll, E. Isern, E. Sicard, A. Rubio\",\"doi\":\"10.1109/MWSCAS.1991.252178\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shows how crosstalk coupling between signals with concurrent transitions can cause a significant increase in or a reduction of the propagation delay of CMOS logic cells connected to them. A reduced model for parasitic capacitive coupling is proposed, and the influence of electrical cell parameters on the internal delay is evaluated. As an application example, the authors analyze how an enlarged delay due to crosstalk can cause permanent logic faults in RS latch circuits.<<ETX>>\",\"PeriodicalId\":6453,\"journal\":{\"name\":\"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems\",\"volume\":\"34 1\",\"pages\":\"387-390 vol.1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.1991.252178\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.1991.252178","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of cross-talk effects on logic cell delays in CMOS integrated circuits
Shows how crosstalk coupling between signals with concurrent transitions can cause a significant increase in or a reduction of the propagation delay of CMOS logic cells connected to them. A reduced model for parasitic capacitive coupling is proposed, and the influence of electrical cell parameters on the internal delay is evaluated. As an application example, the authors analyze how an enlarged delay due to crosstalk can cause permanent logic faults in RS latch circuits.<>