功率门控输电网的去耦电容设计策略

Tong Xu, Peng Li, S. Sundareswaran
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引用次数: 2

摘要

功率门控是现代芯片设计中广泛采用的一种漏电节电策略。然而,电源门控引入了独特的电源完整性问题以及开关和涌流(唤醒)电源噪声之间的权衡。同时,从本质上讲,节能与电源完整性是相互权衡的。此外,这些权衡会随着电源电压的变化而显著变化。在本文中,我们提出了系统去耦电容器(decaps)优化策略,在功率完整性和漏电节约之间进行最佳权衡。针对单一电源电压水平的电源门控pdn的功率完整性与漏电节约之间的紧密关系,提出了新的全局封装和可路由封装设计概念。此外,我们提出了一种灵活的deccap分配技术来处理多个电源电压水平下的设计权衡。所提出的策略在自动设计流程中实现,以选择最佳数量的局部封装、全局封装和可路由封装。实验表明,与传统的单电源电压水平PDN设计方法相比,采用本文提出的技术可以显著增加漏电节约,而不会损害电源的完整性。对于在两个电源电压水平下工作的PDN设计,在每个电压水平下都能实现最佳性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Decoupling Capacitance Design Strategies for Power Delivery Networks with Power Gating
Power gating is a widely used leakage power saving strategy in modern chip designs. However, power gating introduces unique power integrity issues and trade-offs between switching and rush current (wake-up) supply noises. At the same time, the amount of power saving intrinsically trades off with power integrity. In addition, these trade-offs significantly vary with supply voltage. In this article, we propose systemic decoupling capacitors (decaps) optimization strategies that optimally trade-off between power integrity and leakage saving. Specially, new global decap and reroutable decap design concepts are proposed to relax the tight interaction between power integrity and leakage saving of power gated PDNs with a single supply voltage level. Furthermore, we propose a flexible decap allocation technique to deal with the design trade-offs under multiple supply voltage levels. The proposed strategies are implemented in an automatic design flow for choosing the optimal amount of local decaps, global decaps and reroutable decaps. The conducted experiments demonstrate that leakage saving can be increased significantly compared with the conventional PDN design approach with a single supply voltage level using the proposed techniques without jeopardizing power integrity. For PDN designs operating at two supply voltage levels, the optimal performance is achieved at each voltage level.
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