{"title":"V6:在BER II处的反射计","authors":"M. Trapp","doi":"10.17815/JLSRF-3-154","DOIUrl":null,"url":null,"abstract":"V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.","PeriodicalId":16282,"journal":{"name":"Journal of large-scale research facilities JLSRF","volume":"12 1","pages":"114"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"V6: The Reflectometer at BER II\",\"authors\":\"M. Trapp\",\"doi\":\"10.17815/JLSRF-3-154\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.\",\"PeriodicalId\":16282,\"journal\":{\"name\":\"Journal of large-scale research facilities JLSRF\",\"volume\":\"12 1\",\"pages\":\"114\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of large-scale research facilities JLSRF\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17815/JLSRF-3-154\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of large-scale research facilities JLSRF","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17815/JLSRF-3-154","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.
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