一个高性能,但简单的设计,数字友好型锁相环

Ahmad Sharkia, S. Aniruddhan, S. Shekhar, S. Mirabbasi
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引用次数: 5

摘要

模拟ii型锁相环(pll)在环滤波器(LF)中消耗面积大,并且使用噪声大且难以设计的电荷泵(CP)。全数字锁相环对时间-数字转换器(tdc)有严格的抖动要求。我们提出了一种i型锁相环,它消耗的LF面积小,不需要产生偏置电路或CP,功耗低。从相频检测器(PFD)输出的脉宽调制(PWM)电压被馈送到一个简单的RC单极LF。传统i型拓扑的两个主要限制——锁相范围有限和参考杂散较大——通过分别结合电压升压器、数字电平移位器和采样保持(S/H)包络检测器来增加PFD增益,从而克服了这些限制。此外,提出了一种饱和pfd (SPFD),以减少周期滑动,进一步提高锁定范围和锁定时间。一个2.2- 2.8 GHz的原型锁相环在0.13 um CMOS中占据0.12 mm2的核心面积,实现490 fsrms随机抖动,-103.4 dBc/Hz带内相位噪声,-65 dBc参考杂散,2.5 (s)最坏情况锁时间,同时消耗6.8 mW的1.2 V电源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A high-performance, yet simple to design, digital-friendly type-I PLL
Analog Type-II phase-locked loops (PLLs) consume large area in loop-filter (LF) and employ noisy and difficult-to-design charge-pump (CP). All-digital PLLs have strict jitter requirements on time-to-digital converters (TDCs). We propose a Type-I PLL that consumes small LF area, requires no bias-generation circuits or CP, and consumes low power. A pulse-width-modulated (PWM) voltage output from the phase-frequency detector (PFD) is fed to a simple RC single-pole LF. Two major limitations of conventional Type-I topologies - limited lock-range and large reference spur - are overcome by increasing the PFD gain with a combination of a voltage booster and a digital level shifter, and a sample-and-hold (S/H) envelope detector, respectively. Furthermore, a saturated-PFD (SPFD) is proposed to reduce cycle slipping and further improve the lock-range and lock-time. A prototype 2.2-to-2.8 GHz PLL occupies a core area of 0.12 mm2 in 0.13-um CMOS and achieves 490 fsrms random jitter, -103.4 dBc/Hz in-band phase noise, -65 dBc reference spur, 2.5 (is worst-case lock-time while consuming 6.8 mW from a 1.2 V supply.
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