太赫兹薄膜测量中的标准子效应

2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Pub Date : 2020-11-08 DOI:10.1109/IRMMW-THz46771.2020.9370451

U. Schade, L. Puskar, E. Ritter, J. Beckmann

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引用次数: 0

摘要

太赫兹透射光谱中的标准子效应，无论是时域还是频域，往往会阻碍甚至阻碍薄膜性质的解释。本文讨论了近红外和中红外光谱方法在太赫兹光谱范围内消除透射光谱条纹的可转移性和适用性。

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Etalon Effects in THz Film Measurements

Etalon effects in THz transmittance spectra, either taken in time- domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods typically employed in the near and mid infrared spectral range to eliminate the fringes in the transmittance spectra in the THz spectral range.

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2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

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