介电薄膜的复杂电、热、辐射老化

IEEE Transactions on Electrical Insulation Pub Date : 1993-10-01 DOI:10.1109/14.237741

J. Laghari

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引用次数: 10

摘要

综述了单独或同时存在的电、热、辐射应力对介质薄膜的影响。简要介绍了在这些应力下加速老化的类型以及用于评估实验寿命数据的统计方法，包括双参数威布尔分布和对数正态分布。讨论了目前用于老化的实验寿命模型。介绍了电介质薄膜复杂的电/热/辐射老化的最新数据。>

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Complex electrical thermal and radiation aging of dielectric films

The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. The types of accelerated aging under these stresses and the statistical methods used to evaluate the experimental data for life, including the two-parameter Weibull and the log-normal distributions, are described briefly. The experimental life models currently used for aging are discussed. Recent data on the complex electrical/thermal/radiation aging of dielectric films are described. >

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IEEE Transactions on Electrical Insulation

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