致编辑的信:关于光反射技术在表面检测分析物浓度的分辨率限制

A. García-Valenzuela, J. Saniger
{"title":"致编辑的信:关于光反射技术在表面检测分析物浓度的分辨率限制","authors":"A. García-Valenzuela, J. Saniger","doi":"10.1088/0963-9659/7/6/003","DOIUrl":null,"url":null,"abstract":"We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.","PeriodicalId":20787,"journal":{"name":"Pure and Applied Optics: Journal of The European Optical Society Part A","volume":"2016 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"LETTER TO THE EDITOR: On the limit to the resolution of photoreflectance techniques for sensing analyte concentration at surfaces\",\"authors\":\"A. García-Valenzuela, J. Saniger\",\"doi\":\"10.1088/0963-9659/7/6/003\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.\",\"PeriodicalId\":20787,\"journal\":{\"name\":\"Pure and Applied Optics: Journal of The European Optical Society Part A\",\"volume\":\"2016 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Pure and Applied Optics: Journal of The European Optical Society Part A\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0963-9659/7/6/003\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pure and Applied Optics: Journal of The European Optical Society Part A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0963-9659/7/6/003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

我们讨论了接近于由分析物在薄膜表面上的吸收或吸附引起的射噪声限制反射差测量的可能性,并估计了各种情况下的分辨率。当使用1mw光束时,分辨率的极限通常对应于分析物单层的一小部分或非常小的部分。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
LETTER TO THE EDITOR: On the limit to the resolution of photoreflectance techniques for sensing analyte concentration at surfaces
We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.
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