Rietveld refinement of Al0.492Cr1.133 Fe0.78 Mg0.499 Ni0.007 O4 Si0.001 Ti0.082 Zn0.005 composite synthesized by coprecipitation method

Here we report the synthesis of Al0.492Cr1.133 Fe0.78 Mg0.499 Ni0.007 O4 Si0.001 Ti0.082 Zn0.005 (chromite) using a wet chemical approach i.e Coprecipitation method. The prepared powdered composite was structurally characterized through X-ray diffraction analysis. The XRD data was refined by MAUD and Fullprof suit software. Rietveld analysis based on structure and microstructure refinement has been used for precise determination of many microstructural parameters such as Wyckoff positions, intensity, Miller indices value, and interatomic distance. X-ray diffraction and Rietveld analysis shows that prepared sample of composites has a single cubic phase of chromite with space group Fd-3m. R-Factor (Profile R factor (Rp), Weighted R Factor (Rwp), Expected values (Rexp), Bragg R Factor (RB), Rf-Factor), goodness fit factor(χ2), have been calculated. The lower values of profile parameters such as Rp, Rwp, RB,Rexp,Rf, χ2 indicated that the calculated diffraction pattern is in fair agreement with observed pattern. Some of the applications of Chromite have also been highlighted.Here we report the synthesis of Al0.492Cr1.133 Fe0.78 Mg0.499 Ni0.007 O4 Si0.001 Ti0.082 Zn0.005 (chromite) using a wet chemical approach i.e Coprecipitation method. The prepared powdered composite was structurally characterized through X-ray diffraction analysis. The XRD data was refined by MAUD and Fullprof suit software. Rietveld analysis based on structure and microstructure refinement has been used for precise determination of many microstructural parameters such as Wyckoff positions, intensity, Miller indices value, and interatomic distance. X-ray diffraction and Rietveld analysis shows that prepared sample of composites has a single cubic phase of chromite with space group Fd-3m. R-Factor (Profile R factor (Rp), Weighted R Factor (Rwp), Expected values (Rexp), Bragg R Factor (RB), Rf-Factor), goodness fit factor(χ2), have been calculated. The lower values of profile parameters such as Rp, Rwp, RB,Rexp,Rf, χ2 indicated that the calculated diffraction pattern is in fair agreement with observed patter...