焊料体积对形状设计CuCGA互连可靠性的影响

C. Tian, Zhili Zhao, Lifeng Wang, Meina Liu
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引用次数: 0

摘要

在CuCGA (Cu柱网格阵列)封装中,失效首先发生在焊料/铜柱界面处的焊料圆角处,裂纹沿铜柱外围扩展。因此,我们改进了铜柱的形状,将铜柱的两个底部做成漏斗状。在对接可靠性评估的基础上,建立了双漏斗型CuCGA焊点的三维模型,并通过有限元分析软件分析了焊料体积对双漏斗型CuCGA焊点应变分布的影响。结果表明:当铜柱形成双漏斗状时,钎料的峰值应变较常规CuCGA明显降低;当焊料体积在一定范围内变化时,所设计的CuCGA互连具有良好的综合性能。结构的可靠性也可以得到提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of solder volume on reliability in shape-designed CuCGA interconnect
In the CuCGA (Cu column grid array ) package, the failure occur first in the solder fillet at the solder/copper column interface and the crack propagates along the periphery of the copper column. So we have improved Cu column's shape by making the two bottoms of copper column into funnel-shape. Based on the reliability evaluation of interconnect, we established three-dimensional models of the double funnel-shaped CuCGA and analysed the influence of solder volume on strain distribution of double funnel-shaped CuCGA solder joint through finite element analysis software. The results indicate that, when the Cu column is made into double funnel-shape, the peak strain of solder fillers obvious decreases compared with that of conventional CuCGA. And the designed CuCGA interconnect has good comprehensive properties when the solder volume changes in a certain range. The reliability of structure can also be improved.
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