ATE和测试设备供应商;硬件不是软件

2007 IEEE International Test Conference Pub Date : 2014-10-01 DOI:10.1109/TEST.2014.7035291

M. Roos

{"title":"ATE和测试设备供应商;硬件不是软件","authors":"M. Roos","doi":"10.1109/TEST.2014.7035291","DOIUrl":null,"url":null,"abstract":"Adaptive test is a must have to be competitive in the future, and we need better data to support it, and that data has to come from the testers. Now, could someone please tell us how to do it? Because it seems that everyone wants AT, but only a few are willing to pay extra for it.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"123 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ATE and test equipment vendors; Hardware not software\",\"authors\":\"M. Roos\",\"doi\":\"10.1109/TEST.2014.7035291\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Adaptive test is a must have to be competitive in the future, and we need better data to support it, and that data has to come from the testers. Now, could someone please tell us how to do it? Because it seems that everyone wants AT, but only a few are willing to pay extra for it.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"123 1\",\"pages\":\"1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2014.7035291\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2014.7035291","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

适应性测试在未来的竞争中是必须的，我们需要更好的数据来支持它，而这些数据必须来自测试人员。现在，有人能告诉我们怎么做吗?因为似乎每个人都想要AT，但只有少数人愿意为此支付额外费用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

ATE and test equipment vendors; Hardware not software

Adaptive test is a must have to be competitive in the future, and we need better data to support it, and that data has to come from the testers. Now, could someone please tell us how to do it? Because it seems that everyone wants AT, but only a few are willing to pay extra for it.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2007 IEEE International Test Conference

自引率

0.00%

发文量