M. Neumayer, T. Suppan, T. Bretterklieber, H. Wegleiter, C. Fox
{"title":"电容层析成像中有限元模拟的快速数值技术","authors":"M. Neumayer, T. Suppan, T. Bretterklieber, H. Wegleiter, C. Fox","doi":"10.1108/compel-01-2023-0017","DOIUrl":null,"url":null,"abstract":"\nPurpose\nNonlinear solution approaches for inverse problems require fast simulation techniques for the underlying sensing problem. In this work, the authors investigate finite element (FE) based sensor simulations for the inverse problem of electrical capacitance tomography. Two known computational bottlenecks are the assembly of the FE equation system as well as the computation of the Jacobian. Here, existing computation techniques like adjoint field approaches require additional simulations. This paper aims to present fast numerical techniques for the sensor simulation and computations with the Jacobian matrix.\n\n\nDesign/methodology/approach\nFor the FE equation system, a solution strategy based on Green’s functions is derived. Its relation to the solution of a standard FE formulation is discussed. A fast stiffness matrix assembly based on an eigenvector decomposition is shown. Based on the properties of the Green’s functions, Jacobian operations are derived, which allow the computation of matrix vector products with the Jacobian for free, i.e. no additional solves are required. This is demonstrated by a Broyden–Fletcher–Goldfarb–Shanno-based image reconstruction algorithm.\n\n\nFindings\nMATLAB-based time measurements of the new methods show a significant acceleration for all calculation steps compared to reference implementations with standard methods. E.g. for the Jacobian operations, improvement factors of well over 100 could be found.\n\n\nOriginality/value\nThe paper shows new methods for solving known computational tasks for solving inverse problems. A particular advantage is the coherent derivation and elaboration of the results. The approaches can also be applicable to other inverse problems.\n","PeriodicalId":55233,"journal":{"name":"Compel-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering","volume":"144 1","pages":""},"PeriodicalIF":1.0000,"publicationDate":"2023-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fast numerical techniques for FE simulations in electrical capacitance tomography\",\"authors\":\"M. Neumayer, T. Suppan, T. Bretterklieber, H. Wegleiter, C. Fox\",\"doi\":\"10.1108/compel-01-2023-0017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\nPurpose\\nNonlinear solution approaches for inverse problems require fast simulation techniques for the underlying sensing problem. In this work, the authors investigate finite element (FE) based sensor simulations for the inverse problem of electrical capacitance tomography. Two known computational bottlenecks are the assembly of the FE equation system as well as the computation of the Jacobian. Here, existing computation techniques like adjoint field approaches require additional simulations. This paper aims to present fast numerical techniques for the sensor simulation and computations with the Jacobian matrix.\\n\\n\\nDesign/methodology/approach\\nFor the FE equation system, a solution strategy based on Green’s functions is derived. Its relation to the solution of a standard FE formulation is discussed. A fast stiffness matrix assembly based on an eigenvector decomposition is shown. Based on the properties of the Green’s functions, Jacobian operations are derived, which allow the computation of matrix vector products with the Jacobian for free, i.e. no additional solves are required. This is demonstrated by a Broyden–Fletcher–Goldfarb–Shanno-based image reconstruction algorithm.\\n\\n\\nFindings\\nMATLAB-based time measurements of the new methods show a significant acceleration for all calculation steps compared to reference implementations with standard methods. E.g. for the Jacobian operations, improvement factors of well over 100 could be found.\\n\\n\\nOriginality/value\\nThe paper shows new methods for solving known computational tasks for solving inverse problems. A particular advantage is the coherent derivation and elaboration of the results. 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Fast numerical techniques for FE simulations in electrical capacitance tomography
Purpose
Nonlinear solution approaches for inverse problems require fast simulation techniques for the underlying sensing problem. In this work, the authors investigate finite element (FE) based sensor simulations for the inverse problem of electrical capacitance tomography. Two known computational bottlenecks are the assembly of the FE equation system as well as the computation of the Jacobian. Here, existing computation techniques like adjoint field approaches require additional simulations. This paper aims to present fast numerical techniques for the sensor simulation and computations with the Jacobian matrix.
Design/methodology/approach
For the FE equation system, a solution strategy based on Green’s functions is derived. Its relation to the solution of a standard FE formulation is discussed. A fast stiffness matrix assembly based on an eigenvector decomposition is shown. Based on the properties of the Green’s functions, Jacobian operations are derived, which allow the computation of matrix vector products with the Jacobian for free, i.e. no additional solves are required. This is demonstrated by a Broyden–Fletcher–Goldfarb–Shanno-based image reconstruction algorithm.
Findings
MATLAB-based time measurements of the new methods show a significant acceleration for all calculation steps compared to reference implementations with standard methods. E.g. for the Jacobian operations, improvement factors of well over 100 could be found.
Originality/value
The paper shows new methods for solving known computational tasks for solving inverse problems. A particular advantage is the coherent derivation and elaboration of the results. The approaches can also be applicable to other inverse problems.
期刊介绍:
COMPEL exists for the discussion and dissemination of computational and analytical methods in electrical and electronic engineering. The main emphasis of papers should be on methods and new techniques, or the application of existing techniques in a novel way. Whilst papers with immediate application to particular engineering problems are welcome, so too are papers that form a basis for further development in the area of study. A double-blind review process ensures the content''s validity and relevance.