Tan Zhang, Zihe Wang, F. Li, Xuejuan Hu, Wenjun Zhang, Xiaoxu Liu
{"title":"基于深度随机链的表面缺陷自动检测","authors":"Tan Zhang, Zihe Wang, F. Li, Xuejuan Hu, Wenjun Zhang, Xiaoxu Liu","doi":"10.2139/ssrn.4329704","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":12115,"journal":{"name":"Expert Syst. Appl.","volume":"21 1","pages":"120472"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Automatic detection of surface defects based on deep random chains\",\"authors\":\"Tan Zhang, Zihe Wang, F. Li, Xuejuan Hu, Wenjun Zhang, Xiaoxu Liu\",\"doi\":\"10.2139/ssrn.4329704\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":12115,\"journal\":{\"name\":\"Expert Syst. Appl.\",\"volume\":\"21 1\",\"pages\":\"120472\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Expert Syst. Appl.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2139/ssrn.4329704\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Expert Syst. Appl.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.4329704","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6