{"title":"威布尔分布与分析:2019","authors":"Nadia L. Clement, R. Lasky","doi":"10.23919/PanPacific48324.2020.9059313","DOIUrl":null,"url":null,"abstract":"Weibull Analysis, while initially met with skepticism, is now used across many disciplines in reliability and survival analysis. This paper will provide an overview of the Weibull distribution, its variables, the types of data required, and the interpretations that can be drawn from a Weibull distribution. The appendix will provide a tutorial on Weibull Analysis in Minitab.","PeriodicalId":6691,"journal":{"name":"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)","volume":"75 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Weibull Distribution and Analysis: 2019\",\"authors\":\"Nadia L. Clement, R. Lasky\",\"doi\":\"10.23919/PanPacific48324.2020.9059313\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Weibull Analysis, while initially met with skepticism, is now used across many disciplines in reliability and survival analysis. This paper will provide an overview of the Weibull distribution, its variables, the types of data required, and the interpretations that can be drawn from a Weibull distribution. The appendix will provide a tutorial on Weibull Analysis in Minitab.\",\"PeriodicalId\":6691,\"journal\":{\"name\":\"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)\",\"volume\":\"75 1\",\"pages\":\"1-5\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/PanPacific48324.2020.9059313\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/PanPacific48324.2020.9059313","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Weibull Analysis, while initially met with skepticism, is now used across many disciplines in reliability and survival analysis. This paper will provide an overview of the Weibull distribution, its variables, the types of data required, and the interpretations that can be drawn from a Weibull distribution. The appendix will provide a tutorial on Weibull Analysis in Minitab.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
